@article{richard:hal-03703869,
  TITLE = {{Variable-wavelength quick scanning nano-focused X-ray microscopy for in situ strain and tilt mapping}},
  AUTHOR = {Richard, Marie-ingrid and Cornelius, Thomas W and Lauraux, Florian and Molin, Jean-Baptiste and Kirchlechner, Christoph and Leake, Steven J and Carnis, J{\'e}r{\^o}me and Sch{\"u}lli, Tobias U and Thilly, Ludovic and Thomas, Olivier},
  URL = {https://hal.science/hal-03703869},
  JOURNAL = {{Small}},
  PUBLISHER = {{Wiley-VCH Verlag}},
  PAGES = {1905990},
  YEAR = {2020},
  MONTH = Jan,
  DOI = {10.1002/smll.201905990},
  KEYWORDS = {structural microscopy ; strain ; lattice tilt ; in situ ; energy-scanning},
  PDF = {https://hal.science/hal-03703869v1/file/Energy%20strain%20mapping.pdf},
  HAL_ID = {hal-03703869},
  HAL_VERSION = {v1},
}