@article{jagtap:hal-04421733,
  TITLE = {{Understanding crystallization in undoped and nitrogen doped GeTe thin films using substrate curvature measurements}},
  AUTHOR = {Jagtap, Piyush and Guichet, Christophe and Tholapi, Raj and Noe, Pierre and Mocuta, Cristian and Thomas, Olivier},
  URL = {https://hal.science/hal-04421733},
  JOURNAL = {{Materialia}},
  PUBLISHER = {{Elsevier}},
  VOLUME = {28},
  PAGES = {101738},
  YEAR = {2023},
  MONTH = May,
  DOI = {10.1016/j.mtla.2023.101738},
  KEYWORDS = {Phase-change materials GeTe Nitrogen doping crystallization Stress ; Phase-change materials ; GeTe ; Nitrogen doping ; crystallization ; Stress},
  PDF = {https://hal.science/hal-04421733v1/file/Manuscript%20on%20GeTe_Revised.pdf},
  HAL_ID = {hal-04421733},
  HAL_VERSION = {v1},
}